Influence of Radiation Diffraction upon Metrological Parameters of the Ir Line Scanner

− The influence of IR radiation diffraction upon geometrical resolution of the IR line scanner has been analysed in the paper. Analysis of IR line scanner properties in band 3 – 5 μm and 8 – 12 μm proved that when applying the aperture diaphragms the influence of the radiant diffraction upon geometrical resolution may be significant. This influence is stronger for larger fnumbers N in the applied optical systems. It was shown that for large values of f-numbers the thermal resolution of the IR line scanner can be improved by reducing the bandwidth of the electronic system of the scanner, without considerable deterioration of geometrical resolution.